This paper proposes a method to estimate reliability for one-shot systems from subsystem test data when there are no observed failures in the subsystem tests. This method also can be applied to the general cases when failures are observed.
How many of us have wanted to use the HALT data to estimate Annualized Failure Rate (AFR)? The common response is that "it cannot be done." In fact, it is possible but what is needed is a good model and good data to back the model. This paper describes a model that we developed based on HALT experience combined with field data.
Modern consumer electronic products retire at much faster rates than previous generations of products. Neglecting to account for the shortened age of early retired units can lead to inaccurate characterization of the time-to-failure distribution. We present several case studies in which reliability estimates vary significantly, depending on whether retirement is addressed in the analysis, thus demonstrating the practical value of accounting for the product retirement of surviving units.
Ramp up, commercialization or roll-out are all common terms for one stage of a project when it goes from a low level production rate to a high rate. During this time, it is common for new problems to arise and the time to failure remain unknown. When shipping systems without operating time clocks or serialization, only the quantities shipped and quantities replaced are known. This paper will show some common errors with these model attempts that can be avoided.