Design Actions And Solutions For Product Reliability (Session 1C) $150.00
The papers present recommended and new practices, techniques, and new technical design and theoretical solutions for achievement and enhancement of reliability as it is designed into the products.

Moderator
Jeffrey Thomas, Raytheon Missile Systems Division

Fatigue Life of a Design Subject Wide-band Random Loading (Paper 1C1)
Wendai Wang, Ph.D., Applied Materials
This paper proposes a frequency-domain method to predict fatigue life or reliability of a design subject to wide-band random loading for engineering design.
Increasing the reliability self-optimizing railway guidance system (Paper 1C2)
Christoph Sondermann-Wolke, Jens Geisler and Walter Sextro, University of Paderborn
In this paper we present for the first time experimental results of the proposed reliability concept for self-optimizing systems. Firstly, reliability aspects in a self-optimizing system are discussed. Secondly, the proposed reliability concept and the implementation in the active self-optimizing guidance system of a railway vehicle are described. Finally, the experimental tests are evaluated and compared to simulations.
Design for Reliability in Medical Devices (Paper 1C3)
Vaishali Hegde, Philips Respironics, and Dev G. Raheja, PE, CRE, Patient Safety System
The challenges faced by medical device manufacturers in bringing safe, reliable, low overall life-cycle cost products to market in a timely manner is increasing rapidly. With the global recession and increasing safety recalls, a good design for reliability (DFR) program is becoming imperative. However, theoretical knowledge of DFR is not enough. This paper discusses DFR paradigms, developed from years of experience; that are necessary to ensure a successful DFR program.
Soft Error from concept reality Allocation, Prediction Mitigation (Paper 1C4)
Nematollah Bidokhti, Cisco Systems
For a number of years products are being impacted by transient faults that cause the systems to fail and returned to suppliers as returned material authorization (RMA). After further analysis, they deemed to be good and no problem found and ultimately sent back out to potential customers and replacements. These returns are most likely being caused by Single Event Upsets. The phenomenon of Single Event Upset (SEU) is a well known and documented and affects electronic circuitry.