Accelerated Life Testing (ALT) is an effective method of demonstrating and improving product reliability. ALT accelerates a given failure mode by testing at amplified stress level(s) in excess of operational limits. Statistical Analysis is then performed on the data, based on acceleration model to make life predictions at use level. The acceleration model thus forms the basis of accelerated life testing methodology. Well established models such as the Arrhenius model and the Inverse Power model.

This paper explains the technical and mathematical methodology for acceleration of reliability qualification (fixed duration with and without replacement) and reliability assurance tests (SPRT) using physics, engineering rationale, and a mathematical approach in the test design and data analysis. This approach is with the intent to obtain meaningful and relevant information on reliability of products in their actual use and in a cost and schedule effective manner.

Reliability predictions have been for a long time a difficult task because of the antagonism between high reliability level and the weakness of component manufacturer data. A solution to this difficulty is described in this paper using improved models.

Step-Stress Accelerated Degradation Testing (SSADT) is commonly used to evaluate the lifetime of long lifetime and high reliability products. Previous works in SSADT using deterministic function to describe the product degradation process is not adequately